DEFINITIVE REFERENCE FOR INDIAN CENT DIE VARIETIES


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1865 Fancy 5 Variety 18





Obverse 17

Reverse AH



Obverse Diagnostics



Date Position


Reverse Diagnostics



Hub-Through in Shield

Hub-Through of Large Strand and Smaller Strands

Die Chip from E of ONE


Obverse 17 is observed with date position at B.  Obverse 17 develops a rim break from 7:00 to 8:00.

Reverse AH may be identified by a die chip off the lower right side of ON(E) and a thread-like artifact entering the right side of the shield from the right wreath.  Within the vertical bars of the shield, the artifact seems to fray.  In addition, lint hub-throughs are seen throughout the entire wreath.

Comments:  The lint and thread-like artifacts are a result of hub-throughs during the die making process.  These fibers were caught between the working hub and the working die during hubbing impressions, thus the term 'hub-through'.  My explanation of the cause of the reverse anomaly is based on the many lint hub-throughs within the wreath, a well as the fraying of the thread-like artifact within the shield.

All examples I have seen of Variety 18 exhibit the obverse rim break and weakness on the right half of the date and corresponding weakness on the righ half of the shield.  

Plate Coin:  D. Poliquin Collection, AU50

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