Definitive Reference For Indian Cent Die Varieties

DEFINITIVE REFERENCE FOR INDIAN CENT DIE VARIETIES

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1903 Variety 35


Obverse 33	Reverse AI

Obverse Diagnostics

Date Position

Small Die Chip (Click On Image To Enlarge)

Angled View Of Chip (Click On Image To Enlarge)

Repunched 0 Click On Image To Enlarge)

Weak Init. Impression (Click On Image To Enlarge)

Obverse 33 is identified by date placement at C, die chip within the lower loop of the 9 and repunched date that features an initial date impression to the north within the 0. Obverse 33 has developed heavy die flow lines and the following die crack:
1. Light die crack from the top of the right base of the 1 to the 9, where a small die chip develops within the lower loop of the 9.

Reverse AI is rotated 5 degrees clockwise and is in a similar die state as Obverse 33, with the advancement of heavy die flow lines.

Comments: During mid November 2018, David Killough submitted the above Plate Coin based on the Obverse 33 date repunching. David's submission included two examples that resided in the same die state, one graded XF40 plated above and an AU58 example, that differed in the strength of the initial date impression within the 0. I have elected to plate the XF40 example since the initial date impression within the 0 was more distinct than the AU58 example. I have illustrated the AU58 example with the weaker initial date impression above for the purpose of comparing with the more distinct initial date impression from the XF40 plated example.

Plate coin: Courtesy of David Killough Collection, XF40