DEFINITIVE REFERENCE FOR INDIAN CENT DIE VARIETIES


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1863 Variety 33





Obverse 33

Reverse AI




Obverse Diagnostics



Date Position


Repunched 8 to the South

Repunched 3 to the South

Die Chip Between TA of STATES




Reverse Diagnostics



Die Chip on T of CENT

Die Cracks from 12:45 and 2:00

Die Crack from 3:45



Obverse 33 is identified by repunching to the south on the 8 and 3 and a triangular die chip located between the TA of STATES.  Obverse 33 develops a rim break directly below the 86 of the date.

Reverse AI may be identified by a moderately sized die chip within the T of CENT.  The following die cracks are observed for Reverse AI:
1.  Die crack from the denticles at 12:45 through the horizontal shield lines of the shield.
2.  Die crack intersects die crack from #1 and continues downward to the middle arrowhead.
3.  Die crack from the rim at 2:00 intersects die crack from #2.
4.  Die crack from the rim at 3:45 intersects die crack from #2.

Comments:  The die cracks in the upper right quadrant of reverse AI are moderately heavy with a couple small die breaks evident with the horizontal shield lines and upper right wreath.

Obverse 33 will later be paired with reverse AJ during the variety 34 die pairing.

Plate Coin: courtesy of Craig McClain, MS63 (Discovery piece and plate coin for Snow 23)

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