DEFINITIVE REFERENCE FOR INDIAN CENT DIE VARIETIES


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1884 Variety 6






Obverse 24

Reverse F.2



Obverse Diagnostics



Date Position

Misplaced 8 and 4 (Click Image To Enlarge)

Die Chip (Click Image To Enlarge)



Obverse 24 Die Crack Mapping


Reverse Diagnostics



Hub-Through Artifacts (Click Image To Enlarge)



Reverse F.2 Die Crack Mapping


Obverse 24 is identified by date placement at RH and the tops of a misplaced 8 and 4 digit within the denticles below the primary second 8 and 4 of the date.  Obverse 24 has developed a die chip by 'AMERI(C)A' and the following die crack:
1.  Light die crack connecting the tops of 'U(NITED)'.

The second usage of Reverse F.  Reverse F is rotated 5 degrees counter clockwise and is identified by hub-through artifacts within the upper left of the shield, by the first vertical shield bar, between shield and left wreath and atop left wreath.  The Reverse F die cracks are now incrementally more severe compared to the first usage of Reverse F and are located as follows:
1.  Die crack from the rim at 8:00 extends downward along the lower edge of the top outer olive leaf.
2.  Die crack segment extends through the outer edge of the left wreath between 9:00 and 10:15.
3.  Die crack from the rim at 11:30 extends along the top of the shield.

Comments:  Reverse F was given the moniker 'Star Reverse' due to the star-shaped hub-through artifact located at the upper left of the shield.

Obverse 24 will later be in service paired with Reverse K during the 1884 Variety 21 Die Pairing and Reverse F was previously in service paired with Obverse 5 during the 1884 Variety 1 Die Pairing.

Plate Coin:  Courtesy of David Killough Collection, XF40

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